- testing
- morphology observation
- microstructure analysis
- surface element analysis
- surface foreign body
- component analysis
- mechanical property test
- thermal analysis
- welding qualification
- ct scan
- nondestructive testing
- cross section analysis
- coating thickness
- flame retardant test
- abration test
- coating quality inspection
unknown foreign body analysis
| organic foreign body analysis | inorganic foreign body analysis |
| unknown foreign body analysis | product anomaly comparative analysis |
unknown foreign body analysis mainly aims at making a comprehensive analysis for solving the problem of difficult to distinguish the foreign body type with a combination of organic foreign body analysis and inorganic foreign body analysis. the main analysis methods are following:
| analysis methods | typical applications | characteristics of analysis | the reference standard |
|---|---|---|---|
| infrared spectrum (ftir) | qualitative organic matter; analysis of organic pollutants | micro are analysis can be done; the microscopic measurement aperture can be 8μm or less; according to the requirements to choose the part of sample for analysis. | gb/t 6040-2002 |
| scanning electron microscope and x-ray energy spectrum sem/eds | surface microstructure observation; micron grade size measurement; micro area composition analysis; pollutants analysis | can quickly to do qualitative and quantitative analysis on most of the elements in the micro zone be ~ u of sample at short analysis time | jy/t 010-1996 gb/t 17359-2012 |
| time-of-flight secondary ion mass spectrometry (tof-sims) | surface trace analysis of organic materials and inorganic materials; ion imaging on surface; depth profile analysis | excellent dopant and impurity detection sensitivity can detect ppm or lower concentration depth analysis has good detection limits and depth resolution; analysis of a small area | astm e1078-2009 astm e1504-2011 astm e1829-2009 |
| dynamic secondary ion mass spectrometry(d - sims) | analysis of tiny foreign body on product surface; oxide film thickness analysis; determination of doping elements content | small area analysis, analyze foreign body composition ≥10 μm diameter; shallow depth analysis, measurable ≥1nm sample; high limit detection, usually ppm-ppb level | astm e1078-2009 astm e1504-2011 astm e1829-2009 |
| auger electron spectroscopy (aes) | defect analysis; grain size analysis; depth profile analysis; film composition analysis | analysis of surface micro area can be done; auger element can be obtained directly from the screen. | gb/t 26533-2011 |
| x-ray photoelectron spectroscopy (xps) | organic materials, inorganic materials, stains, the surface of the residue analysis;surface composition and chemical state information; depth profile analysis | analysis of thin layer, the analysis of elements is wide, which can analyze the surface element of 1-12 nm and the element content. | gb/t 30704-2014 |
case analysis:
case background:
a customer receives his customer’s complain that the surface of electronic product has black foreign body and he cannot determine the composition and source. so he asks our company for help to analyze its component and determine its source.
testing methods:
ftir analysis, sem/eds analysis
testing standards:
gb / t 6040-2002 general principle of infrared spectroscopy
jy / t 010-1996 general principle of analytical scanning electron microscopy
gb / t 17359-2012 micro beam analysis spectroscopy quantitative analysis
introduction of analysis methods:
1.there are a large number of black materials found in abnormal position on the surface of the product through a microscope magnification and the surface is clutter, the foreign body was suspected to be mixed foreign body. so ftir and eds analysis is selected to test the foreign body.
2.remove the foreign body by a special tool under the microscope; use ftir to analyze its component and determine its main organic component.
3.and then analyze the infrared spectral, based on the molecular structural features and standard infrared spectrum, it can find that the organic main component is polyurethane resin.
4.testing the foreign body sample by sem/eds to determine the other inorganic components. after stripping gold processing, plating the surface of sample with pt for 30s, and then put the sample into the sem sample room to magnify and observe the testing position, a large number of particles found on the sample surface which are suspected to be inorganic component, analyze the component of particle by eds later.
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| 图谱 | c | o | na | al | si | cl | ca | fe | ni | total/% |
| 1 | 17.3 | 21.5 | 0.9 | 34.5 | 5.1 | 1.4 | 0.4 | 9.9 | 9.1 | 100 |
| 2 | 24.6 | 20.7 | 0.5 | 31.1 | 4.5 | 0.6 | 0.5 | 9.0 | 8.4 | 100 |
| 3 | 66.2 | 13.5 | 0.8 | 7.7 | 1.2 | 1.6 | 0.9 | 2.9 | 5.4 | 100 |
conclusion:
according to the ftir and eds results, there is a lot of ai metal debris other than polyurethane resin and si may be in aluminum alloy components, fe and ni as a base component. through communication with customers, it finds that the contact surface of sample is an aluminum-alloy plate before remove. so the source of al metal debris is the aluminum alloy board, polyurethane resin is fall into the sample surface for its use in the process.
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